Art in Holland

Over Art in Holland

Test equipment for power semiconductors in Si and SiC technology. A solid technical background in the application of high power semiconductors forms the basis for dedicated test equipment for fast and high power semiconductors like IGBTs, MOSFETs and diodes. Recent generations of Si devices and upcoming technologies in SiC benefit from low power losses. The fast switching speed put both device manufacturers, as well as the companies applying these devices, to technical challenges. A good characterization of these devices at conditions representative for the applications is made with dedicated test equipment. Test equipment developed by Martin back in 1995 at ABB in Sweden is still intensively used today to evaluate high power IGBTs for traction applications. The very first experimental SiC diodes with high voltage and low current rating at that time (1998) have been characterized with dedicated equipment from Martins hand. Parameters like Eon, Eoff, Err, Irr, di/dt, du/dt, etc. are determined in a dynamic tester as a function of DC-bus voltage, current, temperature and gate driver. Static testers characterize the on-state voltage. Surge current equipment is used during the development of e.g. SiC devices and to test the performance of power semiconductors at fault situations. Please share your requirements for high power semiconductor testing and characterization and benefit from a wealth of experience.

Trefwoorden

• Igbt, Mosfet And Diode Test And Measurement
• Power Semiconductor Test Equipment
• Sic Characterization

Adres

• Hoofdkantoor

  Orionlaan 495694LM Son en BreugelNoord-Brabant, Nederland